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Simple, fast, and affordable optical measurement of reflective surfaces at nanometric precision

Wyse Light invented coaxial deflectometry to make reliable high accuracy optical measurement of the shape of reflective surfaces easier and more accessible. Shorten your production cycle of precision optics, solve the metrology expert shortage, and eventually increase your competitiveness with our simple to use, fast, and affordable optical metrology instrument for nanometric accuracy full-frame measurement of the shape of reflective surfaces, from planes to freeforms.

Coaxial deflectometry is not sensitive to vibrations or temperature so it is the only technology for high accuracy surface shape measurement of reflective surfaces that operates in the metrology lab and the shop floor as well.

Simplicity

A push-button instrument with no need of fine alignments. To lift the fundamental shape ambiguity associated with deflectometry, we have invented and patented coaxial deflectometry, an innovative implementation that yields nanometric precision that everybody can use.

Performance

Coaxial deflectometry is capable of measuring simple as well as complex shapes even freeforms with no need of surface reference or CGH. Middle and high spatial frequencies are measured with an accuracy better than 5 nm, and the low frequencies with a typical 20 nm accuracy.

Robustness

Integrated calibration bench for camera/lens sight rays characterization. Self-calibrating: camera and screen positions are numerically fine-tuned for each measurement. Low sensitivity to parasitic vibrations: no special concrete slab, no damped optical table required! Measurement possible even in the shop close to the machines with no negative impact on accuracy.

Nanometric accuracy with our easily deployable off-the-shelf table top setup

WYSE light Ray Master is composed of a measurement unit and a display screen that can be used on a regular table top desk, deflectometry being basically insensitive to vibrations.

Comparative results with the best high-end instruments

We have made many measurements of very different samples, and were able to compare our results to the ones obtained by instruments like Taylor&Hobson Luphoscan, DUI Nanomefos, and Zygo interferometers. As an example, on the left, you can see the measurements of a 2 inches diameter spherical mirror with a 200 mm focus performed with interferometry and with our product.

Classic deflectometry vs coaxial deflectometry (patented)

Deflectometry is a technique that has long been known in the field of optical metrology of reflective objects. It is based on the analysis of the image of periodic patterns reflected by the object under examination, that carries in some way information about the object shape.

A well know limitation of deflectometry for shape measurement is a fundamental ambiguity: there is an infinite number of solutions for the shape, depending on the unknown camera-to-object distance. WYSE light patented technology, coaxial deflectometry, overcomes this limitation.

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