Meet us at CIEO in Shenzhen, booth 3C23, together with Lightedgetek, our distributor in China.

We’ll be showcasing our latest developments for fast, accurate and practical 3D shape measurement of reflective optical surfaces — from precision mirrors to demanding freeform and space optics applications.

Come and discuss your measurement challenges with us from today through Friday.

OpticalMetrology #PrecisionOptics #FreeformOptics #SpaceOptics #ShapeMeasurement #ReflectiveSurfaces #CIEO

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This new release brings significant improvements to both WysePrep and WyseLab, from measurement setup and geometry preparation to surface analysis and diagnostics.

A streamlined optical measurement workflow

Release 0.3.0 introduces a substantially simplified workflow for reflective surface metrology.

Part and setup preparation is now clearly handled in WysePrep, while WyseLab focuses on surface measurement and analysis. Screen-shape characterization has also been simplified, with a new Go / No-Go status that gives operators an immediate indication of whether the measurement setup is ready.

The result: fewer steps, clearer navigation and a more efficient path from setup to measurement results.

Faster preparation for complex optical surfaces

WysePrep has been extensively redesigned to simplify the preparation of new optical components and measurement configurations.

The software now supports additional geometry definition methods, including:

• Point-cloud import from .dat files
• Direct import of polynomial surface coefficients
• A wider range of measurement-screen orientations
• New predefined examples for cylindrical, toroidal, convex and off-axis parabolic surfaces

This makes RayMaster easier to configure for a broader range of precision optics, freeform optics and complex reflective surfaces.

New automated controls can also help determine suitable fringe settings and working distance, while providing clearer feedback on the percentage of the optical surface that can be measured.

More insight from every surface measurement

The new version of WyseLab brings additional setup controls, operator safeguards and expanded optical surface analysis.

Zernike polynomial decomposition is now easier to access, providing a clearer view of surface components such as focus, astigmatism, coma and other optical aberrations.

Measurement results also display key surface-quality indicators, including:

• RMS surface deviation
• Peak-to-valley (PV) surface deviation
• Measured part dimensions directly on the result images

These additions make it faster to evaluate optical surface quality and interpret measurement data directly within the RayMaster workflow.

Greater reliability and traceability

Release 0.3.0 also introduces additional safeguards during measurement, including the detection of saturated pixels within the measurement area before acquisition.

Improved error logging provides more useful diagnostic information when technical support is required, helping streamline troubleshooting and improve measurement traceability.

Built for more efficient optical metrology

With release 0.3.0, our focus has been simple: reduce setup complexity, accelerate measurements and make optical surface data easier to interpret.

Whether you are measuring spherical, aspherical, cylindrical, toroidal or freeform reflective optics, this release makes the RayMaster workflow more efficient from preparation to final surface analysis.

L’article RayMaster Software Release 0.3.0: A Faster, Smarter Workflow for Optical Surface Metrology est apparu en premier sur Wyse Light.

This selection recognizes companies from the region that demonstrate strong international potential, technological differentiation, and a clear ambition to grow beyond their domestic market.

For Wyse Light, this recognition marks an important milestone in the development of our company and our technology.

Bringing nanometer-level optical metrology to global markets

Wyse Light develops advanced optical metrology solutions for the ultra-precise measurement of reflective surfaces.

Our technology enables simple, fast and affordable measurement of surface shapes with nanometer-level accuracy, opening new possibilities for industries where optical quality, precision, and reliability are mission-critical.

These applications include space systems, Earth observation, environmental monitoring, advanced optical instrumentation, medical technology, and high-precision manufacturing.

As the demand for increasingly complex and high-performance optical systems continues to grow, accurate and scalable surface measurement is a strategic capability for industrial and scientific players worldwide.

A recognition of our international ambition

The MOCI Awards highlight companies with strong export and international development potential. Being selected as a finalist in the Startup category confirms the relevance of Wyse Light’s positioning at the intersection of deeptech innovation, optical metrology, and global industrial needs.

Our ambition is to make high-precision surface measurement more accessible, more flexible, and better suited to the challenges faced by today’s most demanding technology sectors.

This selection also reflects the strength of the innovation ecosystem in the Auvergne-Rhône-Alpes region, where research, entrepreneurship, and industrial excellence come together to support the emergence of high-impact technologies.

Final pitch in Lyon on June 16

The final stage of the competition will take place during a public event on June 16 in Lyon, where finalists will pitch their company, business model, international strategy, and product differentiation.

Wyse Light will use this opportunity to present its vision for the future of optical metrology and its potential contribution to strategic markets in France, Europe, and beyond.

We would like to thank the jury and the organizers of the MOCI Auvergne-Rhône-Alpes Awards for this recognition. We also congratulate the other finalists and look forward to taking part in the final event.

This nomination strengthens our motivation to continue transforming scientific excellence into practical, high-value solutions for global markets.

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This recognition marks an important milestone for Wyse Light and validates our mission: making high-accuracy optical metrology simpler, faster, and more accessible to industrial companies, research laboratories, and precision optics manufacturers.

International recognition for shopfloor-ready metrology

The Photonics Frontiers Award celebrates applied photonics projects with real-world impact. The 2026 shortlist brings together innovative companies and research teams across fields including biophotonics, quantum technologies, industrial lasers, optical communications, aerospace, and metrology.

Being shortlisted in the Industrial Imaging category is a strong recognition of Wyse Light’s approach: developing an optical metrology solution designed not only for laboratory performance, but also for practical industrial use.Raymaster 10: nanometre-accuracy measurement of reflective surfaces

At the heart of this recognition is Raymaster 10, Wyse Light’s optical metrology instrument based on coaxial deflectometry, an innovative technology developed and patented by Wyse Light.

Raymaster 10 measures the shape of reflective surfaces, from flat optics to freeform components, with typical accuracy of 10–15 nm RMS, approximately λ/40.

The system was designed to bring high-end surface metrology closer to where it is needed. Raymaster 10 can be installed on a standard desk and does not require an optical table, a cleanroom, a dark room, or a temperature-controlled environment. It does not rely on laser interferometry and is insensitive to vibrations.

It is also fast to deploy and simple to operate: the instrument can be unboxed, set up, and running in 10–15 minutes, while a full measurement typically takes 2–3 minutes.

Solving a historical limitation of deflectometry

Deflectometry is a powerful method for measuring reflective surfaces by analysing how a surface distorts the image of reference fringes. However, conventional deflectometry has historically faced a fundamental ambiguity: a single measurement may correspond to multiple possible surface shapes.

Wyse Light’s patented coaxial deflectometry approach removes this ambiguity by performing multiple measurements at different distances, combined with highly accurate identification of the system geometry and minimal user intervention.

This technology has been presented in the Proceedings of SPIE at Optifab 2023, where Wyse Light demonstrated absolute measurements of spheres, aspheres, and freeform optics with accuracy approaching interferometric performance.

From laboratory-grade precision to industrial usability

For manufacturers of precision optics, aerospace systems, defence technologies, semiconductor equipment, and advanced optical systems, the ability to measure complex reflective surfaces quickly and reliably is a major challenge.

With Raymaster 10, Wyse Light aims to reduce the barriers to nanometre-level metrology: fewer complex alignments, no costly accessories dedicated to each sample geometry, and operation by non-expert users.

The instrument can measure a wide range of reflective surfaces, from plane optics to freeforms, without sample-specific accessories such as CGHs or dedicated lenses.

This is exactly the ambition captured by the project shortlisted by Electro Optics: “Bringing nanometre surface metrology to the shopfloor.”

See you at Optatec 2026

The winner of the Photonics Frontiers Award 2026 will be announced during the award ceremony at Optatec 2026, on 6 May 2026 at 15:30, in Frankfurt, at the Exhibitor Forum, Booth 625.

The entire Wyse Light team is proud of this nomination and would like to thank its customers, partners, and supporters for helping advance a new generation of optical metrology instruments.

We look forward to presenting our technology to the international photonics community and continuing to demonstrate that high-accuracy metrology can be precise, fast, and simple to use.

https://www.electrooptics.com/article/meet-photonics-frontiers-award-2026-shortlist

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Main benefit of the new version: simpler and faster measurements whatever the geometry of the samples, taking into account preparation steps for new samples. Full cycle time divided by 2 to 6 depending on sample complexity.

Main features included in the next release:

• suppression of the identification steps required in case of change in working distance
• suppression of screen position identification
• surface shape description improved (simplified user interface, support of more complex and hybrid shapes, explicit zernicke polynoms conventions now supported)

Our booth: You will find us booth #340 from 14 to 15 April.

Event site map: SPIE Photonics Europe 2026

Venue website: Palais de la Musique et des Congrès

Venue location on Google Maps:

L’article Meet us at Photonics Europe in Strasbourg, France, from 04/14 to 04/15 est apparu en premier sur Wyse Light.

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We can also meet before or after the event while we are there. We will be in San Francisco from the 19th to the 23rd of January. You can book our agenda here

We will demonstrate our RayMaster10 M4 and the latest features that we are working on to make nanometer accuracy measurement of reflective surfaces still simpler and faster.

And last but not least, Wyse Light now has a US distributor : Landmark Measurement Solutions. LMS will also be present at Photonics West booth 6634 in Moscone West building level 1.

L’article Meet us at Photonics West 2026 in San Francisco est apparu en premier sur Wyse Light.

Your vote matters!
Support French innovation by voting for Wyse Light and our patented coaxial deflectometry technology, bringing high-precision optical metrology to science and industry worldwide.

Register to attend and vote: https://www.eventbrite.com/e/luminate-finals-2025-tickets-1559708643539?aff=luminate

Thank you to all our partners, clients, and friends for your continued support — let’s make Wyse Light shine!

L’article 🎉 Wyse Light is a Luminate Finalist! est apparu en premier sur Wyse Light.

We’re thrilled to share that Wyse Light and our RayMaster10 system are featured in Photonics Spectra, the leading global magazine for the optics and photonics community.

The article — “Surface Analysis Reaps the Benefits of Deflectometry” — highlights how our coaxial deflectometry technology brings interferometer-level precision to optical surface metrology while remaining simpler, more flexible, and more affordable.

Learn how RayMaster10 is enabling scientists and engineers to measure complex reflective surfaces with nanometric accuracy — from freeform optics to space and semiconductor applications.

Read the full article here: https://www.photonics.com/Articles/Surface-Analysis-Reaps-the-Benefits-of/p5/a71270

A big thank-you to the Photonics Spectra editorial team for showcasing our innovation, and to all our partners and supporters who continue to help us push the limits of optical metrology.

#PhotonicsSpectra #WyseLight #RayMaster10 #OpticalMetrology #Deflectometry #Photonics #Optics #Innovation #PrecisionEngineering #DeepTech #Metrology

L’article Wyse Light and deflectometry featured in Photonics Spectra! est apparu en premier sur Wyse Light.

Wyse Light was honored to be invited by the Optica Rochester Section to speak at the University of Rochester this week October 14.

We had a fantastic opportunity to share our journey, discuss the principles behind our coaxial deflectometry technology, and explore its impact on nanometer-precision optical metrology—from space applications to advanced medical systems.

A big thank you to the organizers, faculty, and students who made this event a success. The questions, ideas, and energy in the room were truly inspiring—and a reminder of how strong the photonics and optics community is here in Rochester.

Event link: https://opticarochester.org/event-6384466?CalendarViewType=1&SelectedDate=10/17/2025

We’re always excited to engage with the next generation of optical scientists and engineers. If you’re interested in learning more about our technology or collaborating, let’s connect!

#WyseLight #Optica #UniversityOfRochester #Photonics #OpticalMetrology #CoaxialDeflectometry #DeepTech #SpaceOptics #MedicalTechnology #RochesterNY #Nanometrology #Innovation

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