We are pleased to announce RayMaster Software Release 0.3.0, a major workflow update designed to make high-accuracy optical surface measurement faster, clearer and easier to operate.
This new release brings significant improvements to both WysePrep and WyseLab, from measurement setup and geometry preparation to surface analysis and diagnostics.
A streamlined optical measurement workflow
Release 0.3.0 introduces a substantially simplified workflow for reflective surface metrology.
Part and setup preparation is now clearly handled in WysePrep, while WyseLab focuses on surface measurement and analysis. Screen-shape characterization has also been simplified, with a new Go / No-Go status that gives operators an immediate indication of whether the measurement setup is ready.
The result: fewer steps, clearer navigation and a more efficient path from setup to measurement results.
Faster preparation for complex optical surfaces
WysePrep has been extensively redesigned to simplify the preparation of new optical components and measurement configurations.
The software now supports additional geometry definition methods, including:
- Point-cloud import from
.datfiles - Direct import of polynomial surface coefficients
- A wider range of measurement-screen orientations
- New predefined examples for cylindrical, toroidal, convex and off-axis parabolic surfaces
This makes RayMaster easier to configure for a broader range of precision optics, freeform optics and complex reflective surfaces.
New automated controls can also help determine suitable fringe settings and working distance, while providing clearer feedback on the percentage of the optical surface that can be measured.
More insight from every surface measurement
The new version of WyseLab brings additional setup controls, operator safeguards and expanded optical surface analysis.
Zernike polynomial decomposition is now easier to access, providing a clearer view of surface components such as focus, astigmatism, coma and other optical aberrations.
Measurement results also display key surface-quality indicators, including:
- RMS surface deviation
- Peak-to-valley (PV) surface deviation
- Measured part dimensions directly on the result images
These additions make it faster to evaluate optical surface quality and interpret measurement data directly within the RayMaster workflow.
Greater reliability and traceability
Release 0.3.0 also introduces additional safeguards during measurement, including the detection of saturated pixels within the measurement area before acquisition.
Improved error logging provides more useful diagnostic information when technical support is required, helping streamline troubleshooting and improve measurement traceability.
Built for more efficient optical metrology
With release 0.3.0, our focus has been simple: reduce setup complexity, accelerate measurements and make optical surface data easier to interpret.
Whether you are measuring spherical, aspherical, cylindrical, toroidal or freeform reflective optics, this release makes the RayMaster workflow more efficient from preparation to final surface analysis.
