Come take a look at the new features that will be released in the next version of our software, discover our projects and latest success stories, and give us new challenges and feature requests to drive our future developments.
Main benefit of the new version: simpler and faster measurements whatever the geometry of the samples, taking into account preparation steps for new samples. Full cycle time divided by 2 to 6 depending on sample complexity.
Main features included in the next release:
- suppression of the identification steps required in case of change in working distance
- suppression of screen position identification
- surface shape description improved (simplified user interface, support of more complex and hybrid shapes, explicit zernicke polynoms conventions now supported)
Our booth: You will find us booth #340 from 14 to 15 April.
Event site map: SPIE Photonics Europe 2026
Venue website: Palais de la Musique et des Congrès
Venue location on Google Maps:
