Wyse Light will be attending OPIE 2025 at Pacifico Yokohama from April 23 to April 25, 2025! Join us on booth No. B-32 of OPTO SCIENCE to discover our latest innovation in optical metrology based on coaxial deflectometry for the absolute shape measurement of reflective surfaces at nanometric accuracy. Any shape from flat to freeform. It does not require any reference surface and that makes a huge difference.
Come and check it or ask for a demo and be amazed !
